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Atomic Force Microscope
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Electron Beam Lithography
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FlexiFab Clean Room
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Focused Ion Beam
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High Temperature Prober
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Interferometer
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Magnetoelectric
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Materials Process Modelling
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Nanowire Contact Lithography
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Optical Characterisation
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PiezoMEMS
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RF Prober
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Scanning Electron Microscope
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Surface Functionalisation
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Temperature RF Prober
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TMD FETs
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