Nanomaterial Characterisation

The nanomaterial characterisation cluster is a comprehensive set of tool for characterisation at nanoscale various type of samples from thin films to nanoscale devices

Description

The nanomaterial characterisation cluster is a comprehensive set of tool for characterisation at nanoscale various type of samples from thin films to nanoscale devices. It includes:

  • MicroRaman
  • Spectroscopic Ellipsometry
  • UV-VIS-NIR to FAR IR spectrophotometry

Specifications

Sample size
Between ∅1cm to ∅10cm in diameter
Spectroscopic ellipsometry
Covers a large spectral range from UV to NIR (190nm to 2100nm) and have built-in wafer scale mapping capabilities
MicroRaman
Uses a 514nm laser excitation and have built in mapping capabilities
UV-VIS-NIR to FAR IR spectrophotometry
Covers a spectral range from 200nm up to 100 microns and offer variable angle transmission and reflection and as well FTIR from Mid to Far IR capabilities

Ascent+ facility
Tyndall

Platform Technologies

  • Nano for Quantum Technologies
  • Disruptive Devices
  • Advanced Integration

Key Enabling Technologies

  • Metrology / Characterisation: Optical characterisation

References

  • Over 120 per-review papers published (see details on ORCID)
  • 8 EU funded projects under FP5, FP6, FP7 and H2020 under ICT related topics

Additional information

Key Enabling Capability

Metrology / Characterisation

Platform Technology

Advanced Integration, Disruptive Devices, Nano for Quantum Technologies

Facility

Tyndall