Description
The nanomaterial characterisation cluster is a comprehensive set of tool for characterisation at nanoscale various type of samples from thin films to nanoscale devices. It includes:
- MicroRaman
- Spectroscopic Ellipsometry
- UV-VIS-NIR to FAR IR spectrophotometry
Specifications
- Sample size
- Between ∅1cm to ∅10cm in diameter
- Spectroscopic ellipsometry
- Covers a large spectral range from UV to NIR (190nm to 2100nm) and have built-in wafer scale mapping capabilities
- MicroRaman
- Uses a 514nm laser excitation and have built in mapping capabilities
- UV-VIS-NIR to FAR IR spectrophotometry
- Covers a spectral range from 200nm up to 100 microns and offer variable angle transmission and reflection and as well FTIR from Mid to Far IR capabilities
Ascent+ facility
Tyndall
Platform Technologies
- Nano for Quantum Technologies
- Disruptive Devices
Key Enabling Capability
- Metrology / Characterisation: Optical characterisation
References
- Over 120 per-review papers published (see details on ORCID)
- 8 EU funded projects under FP5, FP6, FP7 and H2020 under ICT related topics
