Metrology / Characterisation
Metrology and Characterisation
Showing 1–25 of 31 results
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4H-SiC Line
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AFM
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Atomic Force Microscope
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Auger Nanoprobe
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Cathodo-luminescence
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Corrosive Gases Testbed
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Cryogenic Quantum Optics
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Electrical Characterisation
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ESEM
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FIB-SEM
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Focused Ion Beam
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Gas Sensor Testbed
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HAXPES Spectrometer
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High Temperature Prober
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Interferometer
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KPFM
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Magnetoelectric
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Optical Characterisation
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Photoluminescence (PL)
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PhoxLab
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Physical & Failure Analysis
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RF Prober
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Scanning Electron Microscope
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SIMS
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TEM
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