Description
PiezoMEMS processing
- Material Stack
-
Silicon substrate with an optional thermal oxide layer followed by the piezo electric layer of AlScN with a top molybdenum electrode. 8″ wafer
- Single electrode layer stack
- Dual Electrode layer stack
- PiezoMEMS Structures Fabrication
- Piezoelectric MEMS process that combines surface and bulk micromachining to create free standing structures such as piezoelectric cantilevers or membranes for different applications. This process is on 4″ wafer (SOI Substrate) and the piezo layer can be AlN or ScAlN
Specifications
Piezoelectric material properties: d33 in the range of 5 to 6 pC/N
Device properties are design dependent
Ascent+ facility
Tyndall
Platform Technologies
- Nano for Quantum Technologies
- Disruptive Devices
- Advanced Integration
Key Enabling Capability
- Processing
- Devices / Test structures