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ASCENT+
ASCENT+
European Nanoelectronics Network
@ASCENTeuAscentEUResearchGate
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Category: Devices / Test structures

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Home Devices / Test structures

Devices / Test structures

Devices and Test Structures

Showing all 8 results

  • Single and entangled photon emitters at cryogenic temperature

    Cryogenic Photon Emitter

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  • Layout of a discrete HEMT

    GaN HEMT

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  • imec’s GaN-IC MPW shuttle

    GaN-IC MPW

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  • Graphene FET (die)

    Graphene FET

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  • Transconductance

    Graphene FET data

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  • Layout of Asymmetric Half-Bridge Switch

    Half Bridge Switch

    Read more
  • IMEC Half-Bridge with integrated driver in DIL Package

    Half Bridge with Driver

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  • HEMT with integrated driver in a daughter board

    HEMT with Driver

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  • Advanced Integration (4)
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