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ASCENT+
ASCENT+
European Nanoelectronics Network
@ASCENTeuAscentEUResearchGate
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    • Home
    • Consortium
  • Sign Up
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    • Virtual Access
  • Events
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    • Outputs
  • Community
    • Success Stories
    • Small and Medium Enterprises (SME)
    • Videos
    • Research Accelerator
    • Access to Research Infrastructure
      • H2020 INFRAIA 2018-20
      • nffa.eu (nanosciences)
      • microKelvin (ultra low T)
      • Viperlab (Perovskite PV)
  • Contact Us
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Category: Devices / Test structures

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Home Devices / Test structures

Devices / Test structures

Devices and Test Structures

Showing all 9 results

  • Single and entangled photon emitters at cryogenic temperature

    Cryogenic Photon Emitter

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  • Layout of a discrete HEMT

    GaN HEMT

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  • imec’s GaN-IC MPW shuttle

    GaN-IC MPW

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  • Graphene FET (die)

    Graphene FET

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  • Transconductance

    Graphene FET data

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  • Layout of Asymmetric Half-Bridge Switch

    Half Bridge Switch

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  • IMEC Half-Bridge with integrated driver in DIL Package

    Half Bridge with Driver

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  • HEMT with integrated driver in a daughter board

    HEMT with Driver

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  • TMD FETs

    TMD FETs

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Key Enabling Capability

  • Devices / Test structures (9)
  • Metrology / Characterisation (32)
  • Modelling / Databases (7)
  • Processing (27)

By Platform Technology

  • Advanced Integration (4)
  • Disruptive Devices (6)
  • Nano for Quantum Technologies (2)

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This project has received funding from the European Union’s Horizon 2020 research and innovation programme under grant agreements 871130 and 654384.

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