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European Nanoelectronics Network
@ASCENTeuAscentEUResearchGate
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Category: Devices / Test structures

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Home Devices / Test structures

Devices / Test structures

Devices and Test Structures

Showing all 7 results

  • Single and entangled photon emitters at cryogenic temperature

    Cryogenic Photon Emitter

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  • Layout of a discrete HEMT

    GaN HEMT

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  • imec’s GaN-IC MPW shuttle

    GaN-IC MPW

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  • Graphene FET (die)

    Graphene FET

    Read more
  • Layout of Asymmetric Half-Bridge Switch

    Half Bridge Switch

    Read more
  • IMEC Half-Bridge with integrated driver in DIL Package

    Half Bridge with Driver

    Read more
  • HEMT with integrated driver in a daughter board

    HEMT with Driver

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By Platform Technology

  • Advanced Integration (4)
  • Disruptive Devices (4)
  • Nano for Quantum Technologies (1)

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© 2015-20 ASCENT+ Consortium

This project has received funding from the European Union’s Horizon 2020 research and innovation programme under grant agreements 871130 and 654384.

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