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ASCENT+
ASCENT+
European Nanoelectronics Network
@ASCENTeuAscentEUResearchGate
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Category: Modelling / Databases

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Home Modelling / Databases

Modelling / Databases

Modelling and Databases

Showing all 7 results

  • Calculated x-ray intensity at 6ps after the pump pulse

    Atomistic Modelling

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  • Transconductance

    Graphene FET data

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  • High Performance Computing Cluster

    Materials Process Modelling

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  • Interface between Au and two monolayers of MoS2

    Metal-MoS2 Interface

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  • MoS2 Crystallisation - Laser Anneal

    MoS2 Crystallisation data

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  • R(V) and I(V) curves as simulated with the model

    Resistive RAM Model

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  • Electron density in the cross section of a trigate silicon transistor

    SiNWs Model

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Ascent+ Showroom

Key Enabling Capability

  • Devices / Test structures (9)
  • Metrology / Characterisation (31)
  • Modelling / Databases (7)
  • Processing (27)

By Platform Technology

  • Disruptive Devices (6)
  • Nano for Quantum Technologies (1)

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This project has received funding from the European Union’s Horizon 2020 research and innovation programme under grant agreements 871130 and 654384.

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