Description
GaN-IC MPW shuttles
Imec’s GaN-on-SOI IC technology circumvents the limitations of GaN discrete components, allowing designers to monolithically integrate components such as half-bridges and GaN drivers onto the same die, minimizing parasitic inductance.
To make this technology available, imec provides extensive GaN-on-SOI Process Design Kits (PDK) for 200V and 650V technologies. These kits include process documentation, library devices, layout guidelines for custom design, verification, and models.
Low-ohmic and high-ohmic resistors are provided as well as Metal/Oxide/Metal capacitors and low voltage logic devices. These enable you to design highly integrated GaN power systems on chip.
The design is fabricated as part of one of the GaN-IC MPW runs at imec. Access to imec’s GaN-IC MPW PDKs after signature of the Design Kit License Agreement. Participants receive a set of bare dies after ~30 weeks after the submission of their GDS. [Run Schedule]
For more information, click here.
Keywords
GaN IC, PDK, MPW, power electronics
Specifications
- PDK: 200V and 650V
- Sample size: 5.18mm × 5.18mm
- Samples/design: 50 to 100
200V e-MODE p-GaN HEMT Datasheet Power Device with Weff=36mm
Symbol | Description | Test Conditions | Min | Typ | Max | Unit |
---|---|---|---|---|---|---|
Absolute Maximum Ratings | ||||||
BVDS | Drain-Source voltage | 200 | V | |||
ID | Pulsed Drain Current | 1 ms pulse | 10 | A | ||
VGS | Gate-Source voltage | 7 | V | |||
On/Off state characteristics | ||||||
BVDS | Drain-Source voltage | VGS=0V, ID=1µA/mm | 200 | V | ||
IDSS | Drain-Source leakage | VGS=0V, VDS=200V | 0.5 | µA | ||
IGSS | Gate-Source leakage | VGS=0V, VDS=200V | 0.27 | µA | ||
RDS-ON | Drain-Source ON resistance | VGS=7V, ID=2A | 0.16 | Ω | ||
VTH | Gate-Source voltage | maximum gm | 2.3 | V | ||
VDS=0.1V, ID=10µA/mm | 1.3 | V | ||||
Dynamic Characteristics | ||||||
CISS | Input capacitance | VGS=3 VDS=200V f=1MHz |
55 | pF | ||
COSS | Output capacitance | 35 | pF | |||
CRSS | Reverse transfer capacitance | 0.97 | pF |
650V e-MODE p-GaN HEMT Datasheet Power Device with Weff=36mm
Symbol | Description | Test Conditions | Min | Typ | Max | Unit |
---|---|---|---|---|---|---|
Absolute Maximum Ratings | ||||||
BVDS | Drain-Source voltage | 650 | V | |||
ID | Pulsed Drain Current | 1 ms pulse | 7.5 | A | ||
VGS | Gate-Source voltage | 7 | V | |||
On/Off state characteristics | ||||||
BVDS | Drain-Source voltage | VGS=0V, ID=1µA/mm | 650 | V | ||
IDSS | Drain-Source leakage | VGS=0V, VDS=650V, T=25°C | 100 | 1000 | nA/mm | |
VGS=0V, VDS=650V, T=150°C | 50 | 500 | nA/mm | |||
IGSS | Gate reverse leakage | VGS=0V, VDS=650V, T=25°C | 50 | 500 | µA | |
RDS-ON | Drain-Source ON resistance | VGS=7V, VDS=0.1V, T=25°C | 14 | 18 | Ω.mm | |
VGS=7V, VDS=0.1V, T=150°C | 30 | 35 | Ω.mm | |||
VTH | Gate threshold voltage | maximum gm | 2.1 | 2.5 | 2.9 | V |
Dynamic Characteristics | ||||||
CISS | Input capacitance | VGS=0 VDS=650V f=1MHz |
47.2 | pF | ||
COSS | Output capacitance | 14.6 | pF | |||
CRSS | Reverse transfer capacitance | 0.12 | pF |
Ascent+ facility
imec
Platform Technologies
- Disruptive Devices
- Advanced Integration
Key Enabling Capability
- Devices / Test structures
- Processing
Typical Applications
- High frequency power converters
- Analog functions, protection circuits → Monolithic buck convertors
- Diagnostic and protection circuits → Undervoltage lock-out, over-temperature protection, over-current-protection
Publication
[DOI: 10.1109/IEDM19573.2019.8993572]