Electrical Characterisation

Wafer level electrical characterisation for memory and RF applications

Description

Wafer level electrical characterisation for memory and RF applications

High statistic parameter test capabilities. Standardised test vehicles as well as flexible test setups enables a wide range of analysis options at ambient as well as at inert atmosphere conditions.

Ascent+ facility
Fraunhofer IPMS-CNT

Platform Technologies

  • Nano for Quantum Technologies
  • Disruptive Devices
  • Advanced Integration

Key Enabling Technologies

  • Metrology / Characterisation: Electrical

Additional information

Key Enabling Capability

Metrology / Characterisation

Platform Technology

Advanced Integration, Disruptive Devices, Nano for Quantum Technologies

Facility

Fraunhofer Mikroelektronik