Description
Wafer level electrical characterisation for memory and RF applications
High statistic parameter test capabilities. Standardised test vehicles as well as flexible test setups enables a wide range of analysis options at ambient as well as at inert atmosphere conditions.
Ascent+ facility
Fraunhofer IPMS
Platform Technologies
- Nano for Quantum Technologies
- Disruptive Devices
- Advanced Integration
Key Enabling Capability
- Metrology / Characterisation: Electrical
