Physical
Physical Characterisation
Showing all 18 results
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AFM
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Atomic Force Microscope
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Auger Nanoprobe
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Cathodo-luminescence
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ESEM
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FIB-SEM
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Focused Ion Beam
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HAXPES Spectrometer
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Interferometer
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KPFM
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Photoluminescence (PL)
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Physical & Failure Analysis
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Scanning Electron Microscope
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SIMS
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TEM
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ToF-SIMS
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XPEEM Spectro-microscope
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XPS – Surface Analysis
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