Physical

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  AFM

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  Atom Probe Tomography (APT)

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  Atomic Force Microscope

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  Auger Nanoprobe

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  Cathodo-luminescence

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  ESEM

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  FIB-SEM

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  Focused Ion Beam

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  HAXPES Spectrometer

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  Interferometer

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  KPFM

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  Photoluminescence (PL)

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  Physical & Failure Analysis

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  Scanning Electron Microscope

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  SIMS

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  TEM

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  ToF-SIMS

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  XPEEM Spectro-microscope

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  XPS – Surface Analysis

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