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ASCENT+
ASCENT+
European Nanoelectronics Network
@ASCENTeuAscentEUResearchGate
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Category: Devices / Test structures

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Home Devices / Test structures

Devices / Test structures

Devices and Test Structures

Showing all 5 results

  • Layout of a discrete HEMT

    GaN HEMT

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  • imec’s GaN-IC MPW shuttle

    GaN-IC MPW

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  • Graphene FET (die)

    Graphene FET

    Read more
  • Transconductance

    Graphene FET data

    Read more
  • Layout of Asymmetric Half-Bridge Switch

    Half Bridge Switch

    Read more
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Key Enabling Capability

  • Devices / Test structures (8)
  • Metrology / Characterisation (32)
  • Modelling / Databases (6)
  • Processing (26)

By Platform Technology

  • Advanced Integration (2)
  • Disruptive Devices (5)

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This project has received funding from the European Union’s Horizon 2020 research and innovation programme under grant agreements 871130 and 654384.

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