The following data is available to registered users:
- Leti-NSP Model: SPICE Model for 3D MOSFETS
- Transistor and test structure specifications
- Process design kits (PDK)
- Electrical characterisation data
- Characterisation and test data provided by ASCENT users
- FinFET and GAA Data (imec)
To access this data, first you must register by filling the Enquiry Form.
For registered users, please click here to access the data repository.
Test chips Documentation and Data (imec)
- FinFET and GAA test chip documentation and DATA
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- Documentation of process assumptions for the test chips
- Inventory of test structure types available on the test chips
- Access to test structures data
- PLANAR test chip documentation and DATA
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- Documentation of process assumptions for the test chips
- Inventory of test structure types available on the test chips
- Access to test structures data
