Outputs

M. Dragoman; M. Aldrigo; S. Iordanescu; M. Modreanu; N. Cordero, “Coupled bow-tie antenna — HfO2 MIM diode for millimetre wave detection applications”, 2017 International Semiconductor Conference (CAS), Sinaia (Romania), 11-14 October 2017, pp. 119-22
DOI: 10.1109/SMICND.2017.8101174

ASCENT Project RefNo 081
Access to Tyndall nano-fabrication facilities.



Yu.V. Gomeniuk, Yu.Yu. Gomeniuk, P.N. Okholin, T.M. Nazarova, K. Cherkaoui, P.K. Hurley and A.N. Nazarov, “Low-temperature RF plasma treatment of junctionless Pd-Al2O3-InGaAs MISFETs”, Promising Trends of Modern Electronics, Informational and Computer systems (MEICS-2017), November 22-24, 2017, Dnipro (Ukraine), pp. 205-6

ASCENT Project RefNo 059
Access to Tyndall



P. Schüffelgen; D. Rosenbach; E. Neumann; M.P. Stehno; M. Lanius; J. Zhao; M. Wang; B. Sheehan; M. Schmidt; B. Gao; A. Brinkman, … “Stencil lithography of superconducting contacts on MBE-grown topological insulator thin films”, Journal of Crystal Growth, vol 477, 1 November 2017, pp 183-7
DOI: 10.1016/j.jcrysgro.2017.03.035

ASCENT Project RefNo 050
Access to Tyndall



J. Muñoz-Gorriz; S. Monaghan; K. Cherkaoui; J. Suñé; P.K. Hurley; E. Miranda, “Spatial analysis of failure sites in large area MIM capacitors using wavelets”, Microelectronic Engineering, vol 178, pp. 10-6
DOI: 10.1016/j.mee.2017.04.011

ASCENT Project RefNo 030
Access to Tyndall



A. Rodriguez-Fernandez; S. Monaghan; J. Suñé; P.K. Hurley; X. Aymerich; E. Miranda, “Nonhomogeneous Generation of Filamentary Paths in High-K Oxide Films Caused by Localized Electrical Stress”, International Workshop on Oxide Electronics, October 2016, Nanjing, China

ASCENT Project RefNo 030
Access to Tyndall



J. Muñoz-Gorriz; S. Monaghan; K. Cherkaoui; J. Suñé; P.K. Hurley; E. Miranda, “Exploring the Breakdown Spot Spatial Distribution in Metal-Insulator-Metal Capacitors Using the Wavelets Method”, DRIP XVII, 17th Conference on defects-recognition, imaging and physics in semiconductors, October 2017, Valladolid, Spain

ASCENT Project RefNo 030
Access to Tyndall



T. Karatsori; C. Theodorou; R. Lavieville; T. Chiarella; J. Mitard; N. Horiguchi; C.A. Dimitriadis; G. Ghibaudo, “Statistical Characterization and Modeling of Drain Current Local and Global Variability in 14nm Bulk FinFETs”, 30th IEEE International Conference on Microelectronic Test Structures (ICMTS), Grenoble (France), 27-30 March 2017, pp. 49-53
DOI: 10.1109/ICMTS.2017.7954263

ASCENT Project RefNo 011
Access to imec

ASCENT Project RefNo 036
Virtual Access



M. Karner; O. Baumgartner; Z. Stanojević; F. Schanovsky; G. Strof; C. Kernstock; H. W. Karner; G. Rzepa; T. Grasset, “Vertically stacked nanowire MOSFETs for sub-10nm nodes: Advanced topography, device, variability, and reliability simulations”, IEEE International Electron Devices Meeting (IEDM), San Francisco (USA), 3-7 Dec 2016, pp. 30.7.1-4
DOI: 10.1109/IEDM.2016.7838516

ASCENT Project RefNo 043
Virtual Access



Ye, Liang, “Molecular monolayers for doping silicon: from doping dose control to device applications”, PhD thesis, Chapter 6, pp. 77-90; Univ. of Twente, ISBN 978.90.365.4149-7
DOI: 10.3990/1.9789036541497 (Open Access)
Univ Twente Repository

ASCENT Project RefNo 029
Access to Tyndall